Anleggsmaskiner og utstyr
Das Ferdinand-Braun-Institut gGmbH, Leibniz-Institut für Höchstfrequenztechnik, plant die Beschaffung eines Hochfrequenz-HF-Messsystems für die On-Wafer-Charakterisierung, das für die elektrische Charakterisierung von Halbleiterbauelementen, Schaltungen und Demonstratoren im mmWave-Frequenzbereich eingesetzt werden soll. Das System soll automatisierte, hochpräzise Messungen ermöglichen und eine vielseitige Plattform für HF-Analysen bieten, einschließlich Netzwerk- und Spektrummessungen.
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- Kontakt navn
- Kerstin Tobis
- Kontakt telefon
- 03063928384
- Kontakt e-post
- kerstin.tobis@fbh-berlin.de
- Adresse
- Gustav-Kirchhoff-Straße 4, 12489 Berlin
The Ferdinand-Braun-Institut (FBH) plans to procure a high-frequency RF measurement system for on-wafer characterisation within the framework of the EU-funded APECS programme. The system will be used for the electrical characterisation of semiconductor devices, circuits and demonstrators, including single-ended and differential measurements in the mmWave frequency range. It is intended to support advanced heterointegration processes and ensure reliable and high-quality measurement results. The equipment shall enable automated, high-precision measurements and provide a versatile platform for RF analysis, including network and spectrum measurements. It will be integrated into existing cleanroom and measurement environments. The procurement procedure is planned for 2026.
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Se hele utlysningen
- Tittel
- Prior Information Notice – RF Measurement System for On-Wafer Characterisation
- Hovedkode
- Tilleggskoder
- Estimert verdi
- 650 000,00 €
Ingen tilleggskoder fra innkjøper …