Anleggsmaskiner og utstyr
Das Ferdinand-Braun-Institut gGmbH, Leibniz-Institut für Höchstfrequenztechnik, plant die Beschaffung eines automatisierten RF-On-Wafer-Probing-Systems zur elektrischen Charakterisierung von Halbleiterbauelementen, Schaltungen und Demonstratoren auf Wafer-Ebene. Dieses System soll Hochfrequenz- und mmWave-Messungen unter kontrollierten und reproduzierbaren Bedingungen ermöglichen und die automatisierte Prüfung von Wafern bis zu 200 mm Durchmesser unterstützen.
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- Kontakt navn
- Kerstin Tobis
- Kontakt telefon
- 03063928384
- Kontakt e-post
- kerstin.tobis@fhb-berlin.de
- Adresse
- Gustav-Kirchhoff-Straße 4, 12489 Berlin
The Ferdinand-Braun-Institut (FBH) plans to procure an automated RF on-wafer probing system within the framework of the EU-funded APECS programme. The system will be used for electrical characterisation of semiconductor devices, circuits and demonstrators at wafer level. It is intended to enable high-frequency and mmWave measurements under controlled and reproducible conditions. The equipment shall support automated probing of wafers up to 200 mm in diameter and provide a versatile platform for a wide range of RF measurements. It will be installed in a cleanroom environment and integrated into existing measurement and process workflows. The procurement procedure is planned for 2026.
Kvalifikasjonskrav
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Tildelingskriterier
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Se hele utlysningen
- Tittel
- Prior Information Notice – RF On-Wafer Probe Station
- Hovedkode
- Tilleggskoder
- Estimert verdi
- 350 000,00 €
Ingen tilleggskoder fra innkjøper …